References . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82 9 QUADRATIC 0-1 PROGRAMMING 8S 9. 1 Energy Minimization 86 9. 2 Notation and Tenninology . . . . . . . . . . . . . . . . . 87 9. 3 Minimization Technique . . . . . . . . . . . . . . . . . . 88 9. 4 An Example . . . . . . . . . . . . . . . . . . . . . . . . 92 9. 5 Accelerated Energy Minimization. . . . . . . . . . . . . 94 9. 5. 1 Transitive Oosure . . . . . . . . . . . . . . . . . 94 9. 5. 2 Additional Pairwise Relationships 96 9. 5. 3 Path Sensitization . . . . . . . . . . . . . . . . . 97 9. 6 Experimental Results 98 9. 7 Summary. . . . . . . . . . . . . . . . . . . . . . . . . . 100 References . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100 10 TRANSITIVE CLOSURE AND TESTING 103 10. 1 Background . . . . . . . . . . . . . . . . . . . . . . . . 104 10. 2 Transitive Oosure Definition 105 10. 3 Implication Graphs 106 10. 4 A Test Generation Algorithm 107 10. 5 Identifying Necessary Assignments 112 10. 5. 1 Implicit Implication and Justification 113 10. 5. 2 Transitive Oosure Does More Than Implication and Justification 115 10. 5. 3 Implicit Sensitization of Dominators 116 10. 5. 4 Redundancy Identification 117 10. 6 Summary 119 References . . . . . . . . . . . . . . . . . . . . . . . . . . . . 119 11 POLYNOMIAL-TIME TESTABILITY 123 11. 1 Background 124 11. 1. 1 Fujiwara's Result 125 11. 1. 2 Contribution of the Present Work . . . . . . . . . 126 11. 2 Notation and Tenninology 127 11. 3 A Polynomial TlDle Algorithm 128 11. 3. 1 Primary Output Fault 129 11. 3. 2 Arbitrary Single Fault 135 11. 3. 3 Multiple Faults. . . . . . . . . . . . . . . . . . . 137 11. 4 Summary. . . . . . . . . . . . . . . . . . . . . . . . . . 139 References . . . . . . . . . . . . . . . . . . . . . . . . . . . . 139 ix 12 SPECIAL CASES OF HARD PROBLEMS 141 12. 1 Problem Statement 142 12. 2 Logic Simulation 143 12. 3 Logic Circuit Modeling . 146 12. 3. 1 Modelfor a Boolean Gate . . . . . . . . . . . . . 147 12. 3. 2 Circuit Modeling 148 12.

The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

For many years, the dominant fault model in automatic test pattern gen eration (ATPG) for digital integrated circuits has been the stuck-at fault model. The static nature of stuck-at fault testing when compared to the extremely dynamic nature of integrated circuit (IC) technology has caused many to question whether or not stuck-at fault based testing is still viable. Attempts at answering this question have not been wholly satisfying due to a lack of true quantification, statistical significance, and/or high computational expense. In this monograph we introduce a methodology to address the ques tion in a manner which circumvents the drawbacks of previous approaches. The method is based on symbolic Boolean functional analyses using Or dered Binary Decision Diagrams (OBDDs). OBDDs have been conjectured to be an attractive representation form for Boolean functions, although cases ex ist for which their complexity is guaranteed to grow exponentially with input cardinality. Classes of Boolean functions which exploit the efficiencies inherent in OBDDs to a very great extent are examined in Chapter 7. Exact equa tions giving their OBDD sizes are derived, whereas until very recently only size bounds have been available. These size equations suggest that straight forward applications of OBDDs to design and test related problems may not prove as fruitful as was once thought.

In order to design and build computers that achieve and sustain high performance, it is essential that reliability issues be considered care fully. The problem has several aspects. Certainly, considering reliability implies that an engineer must be able to analyze how design decisions affect the incidence of failure. For instance, in order design reliable inte gritted circuits, it is necessary to analyze how decisions regarding design rules affect the yield, i.e., the percentage of functional chips obtained by the manufacturing process. Of equal importance in producing reliable computers is the detection of failures in its Very Large Scale Integrated (VLSI) circuit components, caused by errors in the design specification, implementation, or manufacturing processes. Design verification involves the checking of the specification of a design for correctness prior to carrying out an implementation. Implementation verification ensures that the manual design or automatic synthesis process is correct, i.e., the mask-level description correctly implements the specification. Manufacture test involves the checking of the complex fabrication process for correctness, i.e., ensuring that there are no manufacturing defects in the integrated circuit. It should be noted that all the above verification mechanisms deal not only with verifying the functionality of the integrated circuit but also its performance.

This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.

Over the past decade there has been a dramatic change in the role played by design automation for electronic systems. Ten years ago, integrated circuit (IC) designers were content to use the computer for circuit, logic, and limited amounts of high-level simulation, as well as for capturing the digitized mask layouts used for IC manufacture. The tools were only aids to design-the designer could always find a way to implement the chip or board manually if the tools failed or if they did not give acceptable results. Today, however, design technology plays an indispensable role in the design ofelectronic systems and is critical to achieving time-to-market, cost, and performance targets. In less than ten years, designers have come to rely on automatic or semi automatic CAD systems for the physical design ofcomplex ICs containing over a million transistors. In the past three years, practical logic synthesis systems that take into account both cost and performance have become a commercial reality and many designers have already relinquished control ofthe logic netlist level of design to automatic computer aids. To date, only in certain well-defined areas, especially digital signal process ing and telecommunications. have higher-level design methods and tools found significant success. However, the forces of time-to-market and growing system complexity will demand the broad-based adoption of high-level, automated methods and tools over the next few years.

Annotation. Presents the latest research findings in theory, techniques, algorithms, and major applications of pattern recognition and computer vision, as well as new hardware and architecture aspects. Contains sections on basic methods in pattern recognition and computer vision, nine recognition applications, inspection and robotic applications, and architectures and technology. Some areas discussed include cluster analysis, 3D vision of dynamic objects, speech recognition, computer vision in food handling, and video content analysis and retrieval. This second edition is extensively revised to describe progress in the field since 1993. Chen is affiliated with the electrical and computer engineering department at the University of Massachusetts-Dartmouth. Annotation copyrighted by Book News, Inc., Portland, OR.

"The book provides an up-to-date and authoritative treatment of pattern recognition and computer vision, with chapters written by leaders in the field. On the basic methods in pattern recognition and computer vision, topics range from statistical pattern recognition to array grammars to projective geometry to skeletonization, and shape and texture measures."--BOOK JACKET.

After alm ost three scores of years of basic and applied research, the field of speech processing is, at present, undergoing a rapid growth in terms of both performance and applications and this is fueHed by the advances being made in the areas of microelectronics, computation and algorithm design.Speech processing relates to three aspects of voice communications: -Speech Coding and transmission which is mainly concerned with man-to man voice communication. -Speech Synthesis which deals with machine-to-man communication. -Speech Recognition which is related to man-to-machine communication. Widespread application and use of low-bit rate voice codec.>, synthesizers and recognizers which are all speech processing products requires ideaHy internationally accepted quality assessment and evaluation methods as weH as speech processing standards so that they may be interconnected and used independently of their designers and manufacturers without costly interfaces. This book presents, in a tutorial manner, both fundamental and applied aspects of the above topics which have been prepared by weH-known specialists in their respective areas. The book is based on lectures which were sponsored by AGARD/NATO and delivered by the authors, in several NATO countries, to audiences consisting mainly of academic and industrial R&D engineers and physicists as weH as civil and military C3I systems planners and designers.

Reasoning in Boolean Networks provides a detailed treatment of recent research advances in algorithmic techniques for logic synthesis, test generation and formal verification of digital circuits. The book presents the central idea of approaching design automation problems for logic-level circuits by specific Boolean reasoning techniques. While Boolean reasoning techniques have been a central element of two-level circuit theory for many decades Reasoning in Boolean Networks describes a basic reasoning methodology for multi-level circuits. This leads to a unified view on two-level and multi-level logic synthesis. The presented reasoning techniques are applied to various CAD-problems to demonstrate their usefulness for today's industrially relevant problems. Reasoning in Boolean Networks provides lucid descriptions of basic algorithmic concepts in automatic test pattern generation, logic synthesis and verification and elaborates their intimate relationship to provide further intuition and insight into the subject. Numerous examples are provide for ease in understanding the material. Reasoning in Boolean Networks is intended for researchers in logic synthesis, VLSI testing and formal verification as well as for integrated circuit designers who want to enhance their understanding of basic CAD methodologies.