"This groundbreaking book focuses on near-field microscopy which has opened up optical processes at the nanoscale for direct inspection. Further, it explores the emerging area of nano-optics which promises to make possible optical microscopy with true nanometer resolution. This frontline resource helps you achieve high resolution optical imaging of biological species and functional materials. You also find guidance in the imaging of optical device operation and new nanophotonics functionalities"--EBL.

"This groundbreaking book focuses on near-field microscopy which has opened up optical processes at the nanoscale for direct inspection. Further, it explores the emerging area of nano-optics which promises to make possible optical microscopy with true nanometer resolution. This frontline resource helps you achieve high resolution optical imaging of biological species and functional materials. You also find guidance in the imaging of optical device operation and new nanophotonics functionalities"--EBL.

Fully revised and in its second edition, this standard reference on nano-optics is ideal for graduate students and researchers alike.

Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples.

Conventional optical science and technology have been restricted by the diffraction limit from reducing the sizes of optical and photoruc devices to nanometric dimensions. Thus, the size of optical integrated circuits has been incompatible with that of their counterpart, integrated electronic circuits, which have much smaller dimensions. This book provides potential ideas and methods to overcome this difficulty. Near-field optics has developed very rapidly from around the middle 1980s after preliminary trials in the microwave frequency region, as proposed as early as 1928. At the early stages of this development, most technical efforts were devoted to realizing super-high-resolution optical microscopy beyond the diffraction limit. However, the possibility of exploiting the optical near-field, phenomenon of quasistatic electromagnetic interaction at subwavelength distances between nanometric particles has opened new ways to nanometric optical science and technology, and many applications to nanometric fabrication and manipulation have been proposed and implemented. Building on this historical background, this book describes recent progress in near-field optical science and technology, mainly using research of the author's groups. The title of this book, Near-Field Nano-Optics-From Basic Principles to Nano-Fabrication and Nano-Photonics, implies capabilities of the optical near field not only for imaging/microscopy, but also for fabrication/manipulation/proc essing on a nanometric scale.

Scanning near-field optical microscopy (SNOM, also known as NSOM) is a new local probe technique with a resolving power of 10--50 nm. Not being limited by diffraction, near-field optics (NFO) opens new perspectives for optical characterization and the understanding of optical phenomena, in particular in biology, microelectronics and materials science. SNOM, after first demonstrations in '83/'84, has undergone a rapid development in the past two to four years. The increased interest has been largely stimulated by the wealth of optical properties that can be investigated and the growing importance of characterization on the nanometer scale in general. Examples include the use of fluorescence, birefrigence and plasmon effects for applications in particular in biology, microelectronics and materials science, to name just a few. This volume emerged from the first international meeting devoted exclusively to NFO, and comprises a complete survey of the 1992 activities in the field, in particular the variety of instrumental techniques that are currently being explored, the demonstration of the imaging capabilities as well as theoretical interpretations - a highly nontrivial task. The comprehensive collection of papers devoted to these and related subjects make the book a valuable tool for anybody interested in near-field optics.

Near-field optics studies the behaviour of light fields in the vicinity of matter, where light is structured in propagating and evanescent fields. Near-field optical microscopy is the straightforward application of near-field optics.This textbook provides an overview for undergraduates and anyone who has an interest in peculiar optical phenomena, and serves as a technical manual for engineers and researchers. It consists of 12 chapters dealing with the history of near-field optics, non-radiating optics, optical noise, inverse problems, theory, instrumentation and applications; there is an appendix including the basic elements of Fourier optics and Maxwell equations.

Scanning Tunneling Microscopy II, like its predecessor, presents detailed and comprehensive accounts of the basic principles and the broad range of applications of STM and related scanning probe techniques. The applications discussed in this volume come predominantly from the fields of electrochemistry and biology. In contrast to those in STM I, these studies may be performed in air and in liquids. The extensions of the basic technique to map other interactions are described in chapters on scanning force microscopy, magnetic force microscopy, and scanning near-field optical microscopy, together with a survey of other related techniques. Also discussed here is the use of a scanning proximal probe for surface modification. Together, the two volumes give a comprehensive account of experimental aspects of STM and provide essential reading and reference material. In this second edition the text has been updated and new methods are discussed.

This consistent and systematic review of recent advances in optical antenna theory and practice brings together leading experts in the fields of electrical engineering, nano-optics and nano-photonics, physical chemistry and nanofabrication. Fundamental concepts and functionalities relevant to optical antennas are explained, together with key principles for optical antenna modelling, design and characterisation. Recognising the tremendous potential of this technology, practical applications are also outlined. Presenting a clear translation of the concepts of radio antenna design, near-field optics and field-enhanced spectroscopy into optical antennas, this interdisciplinary book is an indispensable resource for researchers and graduate students in engineering, optics and photonics, physics and chemistry.

The Encyclopedia of Nanotechnology provides a comprehensive and multi-disciplinary reference to the many fields relevant to the general field of nanotechnology. It aims to be a comprehensive and genuinely international reference work and will be aimed at graduate students, researchers, and practitioners. The Encyclopedia of Nanotechnology introduces a large number of terms, devices and processes which are related to the multi-disciplinary field of Nanotechnology. For each entry in this 4 volume set a 4-10 page description is provided by an expert in the field. Contributions are made by experts from the US, Europe and Asia, making this a comprehensive and truly international Reference Work. The authors are typically from academia, however one quarter of all entries were written by persons from industry. Topics covered in the Reference Work include: - Nano- Microfabrication Processes and Materials for Fabrication - Nanoscale Measurement Techniques - Nanostructures - Nanomaterials - Nanomechanics - Molecular Modeling and Its Role in Advancing Nanotechnology - MEMS/NEMS - Microfluidics and Nanofluidics - Biomedical Engineering and Biodevices - Bio/Nanotechnology and Nanomedicine - Bio/Nanotechnology for cellular engineering - Drug Delivery – Technology and Applications - Assembly - Organic Electronics - Nano-optical Devices - Micro/nano Integration - Materials, Coatings and Surface Treatments for Nanotribology - Micro/NanoReliability – thermal, mechanical etc. - Biomimetics