Mixed Signal Built In Self Test For Analog Circuits
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Author |
: Gordon W. Roberts |
Publisher |
: Springer Science & Business Media |
Total Pages |
: 125 |
Release |
: 2012-12-06 |
ISBN-10 |
: 9781461523413 |
ISBN-13 |
: 1461523419 |
Rating |
: 4/5 (13 Downloads) |
Synopsis Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits by : Gordon W. Roberts
Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique. The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix. The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods.
Author |
: Kristi Maggard |
Publisher |
: |
Total Pages |
: 312 |
Release |
: 1999 |
ISBN-10 |
: OCLC:41670104 |
ISBN-13 |
: |
Rating |
: 4/5 (04 Downloads) |
Synopsis Mixed Signal Based Built-in Self-test for Analog Circuits by : Kristi Maggard
Author |
: Charles E. Stroud |
Publisher |
: |
Total Pages |
: 0 |
Release |
: 1999 |
ISBN-10 |
: OCLC:46427379 |
ISBN-13 |
: |
Rating |
: 4/5 (79 Downloads) |
Synopsis Mixed Signal Built-In Self-Test for Analog Circuits by : Charles E. Stroud
A Built-In Self-Test architecture was developed for testing analog circuits in mixed-signal systems. The Built-In Self-Test circuitry primarily resides in the digital portion of the mixed-signal system in order to minimize performance impact on the analog circuitry. The test pattern generation portion of the Built-In Self-Test circuitry produces a number of different test waveforms found to be effective in detecting faults in the analog circuitry. The output response analysis function consists of a double-precision accumulator that facilitates determination of the faulty/fault-free status of an analog circuit with acceptable component parameter variations. Ten benchmark circuits were established for the evaluation of analog testing approaches along with acceptable component parameter variations and a standard set of faults and fault models for each benchmark circuit. Finally, an equation was developed for the calculation of analog fault coverage that takes into consideration the probability of potential detection of faults due to component parameter variation. Evaluation of the Built-In Self-Test architecture via analog fault simulation using the benchmark circuits and the fault coverage equation indicates that the approach is effective in detecting catastrophe and parametric faults in a wide variety of analog circuits.
Author |
: Charles E. Stroud |
Publisher |
: |
Total Pages |
: 128 |
Release |
: 1999 |
ISBN-10 |
: OCLC:46427379 |
ISBN-13 |
: |
Rating |
: 4/5 (79 Downloads) |
Synopsis Mixed Signal Built-in Self-test for Analog Circuits by : Charles E. Stroud
Author |
: Jose Luis Huertas Díaz |
Publisher |
: Springer Science & Business Media |
Total Pages |
: 310 |
Release |
: 2010-02-23 |
ISBN-10 |
: 9780387235219 |
ISBN-13 |
: 0387235213 |
Rating |
: 4/5 (19 Downloads) |
Synopsis Test and Design-for-Testability in Mixed-Signal Integrated Circuits by : Jose Luis Huertas Díaz
Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck of present and future IC projects. Linking design and test in these heterogeneous systems will have a tremendous impact in terms of test time, cost and proficiency. Although it is recognized as a key issue for developing complex ICs, there is still a lack of structured references presenting the major topics in this area. The aim of this book is to present basic concepts and new ideas in a manner understandable for both professionals and students. Since this is an active research field, a comprehensive state-of-the-art overview is very valuable, introducing the main problems as well as the ways of solution that seem promising, emphasizing their basis, strengths and weaknesses. In essence, several topics are presented in detail. First of all, techniques for the efficient use of DSP-based test and CAD test tools. Standardization is another topic considered in the book, with focus on the IEEE 1149.4. Also addressed in depth is the connecting design and test by means of using high-level (behavioural) description techniques, specific examples are given. Another issue is related to test techniques for well-defined classes of integrated blocks, like data converters and phase-locked-loops. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods. Finally, in Design-for-Testability and Built-In-Self-Test, two other concepts that were taken from digital design, are introduced in an analog context and illustrated for the case of integrated filters. In summary, the purpose of this book is to provide a glimpse on recent research results in the area of testing mixed-signal integrated circuits, specifically in the topics mentioned above. Much of the work reported herein has been performed within cooperative European Research Projects, in which the authors of the different chapters have actively collaborated. It is a representative snapshot of the current state-of-the-art in this emergent field.
Author |
: Bapiraju Vinnakota |
Publisher |
: |
Total Pages |
: 296 |
Release |
: 1998 |
ISBN-10 |
: UOM:39015047075893 |
ISBN-13 |
: |
Rating |
: 4/5 (93 Downloads) |
Synopsis Analog and Mixed-signal Test by : Bapiraju Vinnakota
More and more chips are being designed with both analog and digital circuitry next to each other, which makes testing analog circuitry even more challenging. This comprehensive guide reviews all the potential testing options, helping designers, engineers, CAD developers, and researchers choose the most cost-effective, accurate solutions for both mixed-signal and analog-only testing.
Author |
: Sameer Mangalampalli |
Publisher |
: |
Total Pages |
: 204 |
Release |
: 2003 |
ISBN-10 |
: OCLC:55524965 |
ISBN-13 |
: |
Rating |
: 4/5 (65 Downloads) |
Synopsis A Spectral Based Built-in Self-test Method for Mixed-signal and Analog Circuits by : Sameer Mangalampalli
Author |
: Jila Zakizadeh |
Publisher |
: |
Total Pages |
: 0 |
Release |
: 2005 |
ISBN-10 |
: OCLC:77534179 |
ISBN-13 |
: |
Rating |
: 4/5 (79 Downloads) |
Synopsis Built-in-self-test Techniques for Analog and Mixed Signal Circuits by : Jila Zakizadeh
Author |
: Prithviraj Kabisatpathy |
Publisher |
: Springer Science & Business Media |
Total Pages |
: 183 |
Release |
: 2006-01-13 |
ISBN-10 |
: 9780387257433 |
ISBN-13 |
: 0387257438 |
Rating |
: 4/5 (33 Downloads) |
Synopsis Fault Diagnosis of Analog Integrated Circuits by : Prithviraj Kabisatpathy
Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology. Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits. Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces . Also contains problems that can be used as quiz or homework.
Author |
: M. Bushnell |
Publisher |
: Springer Science & Business Media |
Total Pages |
: 690 |
Release |
: 2006-04-11 |
ISBN-10 |
: 9780306470400 |
ISBN-13 |
: 0306470403 |
Rating |
: 4/5 (00 Downloads) |
Synopsis Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits by : M. Bushnell
The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.