The purpose of the book is to train verification engineers on the breadth of technologies available and to give them a utilitarian methodology for making effective use of those technologies. The book is easy to understand and a joy to read. Its organization follows a ‘typical’ verification project from inception to completion, (planning to closure). The book elucidates concepts using non-technical terms and clear entertaining explanations. Analogies to other fields are employed to keep the book light-hearted and interesting.

This book describes a comprehensive SystemC TLM-driven IP design and verification solution'including methodology guidelines, high-level synthesis, and TLM-aware verification basedon Cadence products'that will help designers transition to a TLM-driven design andverification flow.

This book contains extended and revised versions of the best papers presented at the 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, held in Tallinn, Estonia, in September 2016. The 11 papers included in the book were carefully reviewed and selected from the 36 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the latest scientific and industrial results and developments as well as future trends in the field of System-on-Chip (SoC) Design.

This book consists of various contributions in conjunction with the keywords “reasoning” and “intelligent systems”, which widely covers theoretical to practical aspects of intelligent systems. Therefore, it is suitable for researchers or graduate students who want to study intelligent systems generally.

The Accellera Universal Verification Methodology (UVM) standard is architected to scale, but verification is growing and in more than just the digital design dimension. It is growing in the SoC dimension to include low-power and mixed-signal and the system integration dimension to include multi-language support and acceleration. These items and others all contribute to the quality of the SOC so the Metric-Driven Verification (MDV) methodology is needed to unify it all into a coherent verification plan. This book is for verification engineers and managers familiar with the UVM and the benefits it brings to digital verification but who also need to tackle specialized tasks. It is also written for the SoC project manager that is tasked with building an efficient worldwide team. While the task continues to become more complex, Advanced Verification Topics describes methodologies outside of the Accellera UVM standard, but that build on it, to provide a way for SoC teams to stay productive and profitable.

Improve design efficiency and reduce costs with this practical guide to formal and simulation-based functional verification. Giving you a theoretical and practical understanding of the key issues involved, expert authors including Wayne Wolf and Dan Gajski explain both formal techniques (model checking, equivalence checking) and simulation-based techniques (coverage metrics, test generation). You get insights into practical issues including hardware verification languages (HVLs) and system-level debugging. The foundations of formal and simulation-based techniques are covered too, as are more recent research advances including transaction-level modeling and assertion-based verification, plus the theoretical underpinnings of verification, including the use of decision diagrams and Boolean satisfiability (SAT).

Quality Electronic Design (QED)’s landscape spans a vast region where territories of many participating disciplines and technologies overlap. This book explores the latest trends in several key topics related to quality electronic design, with emphasis on Hardware Security, Cybersecurity, Machine Learning, and application of Artificial Intelligence (AI). The book includes topics in nonvolatile memories (NVM), Internet of Things (IoT), FPGA, and Neural Networks.

This book constitutes the refereed proceedings of the 11th International Haifa Verification Conference, HVC 2015, held in Haifa, Israel, in November 2015. The 17 revised full papers and 4 invited talks presented were carefully reviewed and selected from numerous submissions. The papers are organized in topical sections on hybrid systems; tools; verification of robotics; symbolic execution; model checking; timed systems; SAT solving; multi domain verification; and synthesis.

The first of two volumes in the Electronic Design Automation for Integrated Circuits Handbook, Second Edition, Electronic Design Automation for IC System Design, Verification, and Testing thoroughly examines system-level design, microarchitectural design, logic verification, and testing. Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for integrated circuit (IC) designs, design and verification languages, digital simulation, hardware acceleration and emulation, and much more. New to This Edition: Major updates appearing in the initial phases of the design flow, where the level of abstraction keeps rising to support more functionality with lower non-recurring engineering (NRE) costs Significant revisions reflected in the final phases of the design flow, where the complexity due to smaller and smaller geometries is compounded by the slow progress of shorter wavelength lithography New coverage of cutting-edge applications and approaches realized in the decade since publication of the previous edition—these are illustrated by new chapters on high-level synthesis, system-on-chip (SoC) block-based design, and back-annotating system-level models Offering improved depth and modernity, Electronic Design Automation for IC System Design, Verification, and Testing provides a valuable, state-of-the-art reference for electronic design automation (EDA) students, researchers, and professionals.

This book addresses a means of quantitatively assessing functional verification progress. Without this process, design and verification engineers, and their management, are left guessing whether or not they have completed verifying the device they are designing. Using the techniques described in this book, they will learn how to build a toolset which allows them to know how close they are to functional closure. This is the first book to introduce a useful taxonomy for coverage of metric classification. Using this taxonomy, the reader will clearly understand the process of creating an effective coverage model. This book offers a thoughtful and comprehensive treatment of its subject for anybody who is really serious about functional verification.