Fifty Years Of X Ray Diffraction
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Author |
: Paul Peter Ewald |
Publisher |
: |
Total Pages |
: 748 |
Release |
: 1962 |
ISBN-10 |
: UCAL:B4255494 |
ISBN-13 |
: |
Rating |
: 4/5 (94 Downloads) |
Synopsis Fifty Years of X-ray Diffraction by : Paul Peter Ewald
Author |
: P.P. Ewald |
Publisher |
: Springer Science & Business Media |
Total Pages |
: 735 |
Release |
: 2012-12-06 |
ISBN-10 |
: 9781461599616 |
ISBN-13 |
: 146159961X |
Rating |
: 4/5 (16 Downloads) |
Synopsis Fifty Years of X-Ray Diffraction by : P.P. Ewald
Origin, Scope, and Plan of this Book In July 1962 the fiftieth anniversary of Max von Laue's discovery of the Diffraction of X-rays by crystals is going to be celebrated in Munich by a large international group of crystallographers, physi cists, chemists, spectroscopists, biologists, industrialists, and many others who are employing the methods based on Laue's discovery for their own research. The invitation for this celebration will be issued jointly by the Ludwig Maximilian University of Munich, where the discovery was made, by the Bavarian Academy of Sciences, where it was first made public, and by the International Union of Crystallo graphy, which is the international organization of the National Committees of Crystallography formed in some 30 countries to repre sent and advance the interests of the 3500 research workers in this field. The year 1912 also is the birth year of two branches of the physical sciences which developed promptly from Laue's discovery, namely X-ray Crystal Structure Analysis which is most closely linked to the names ofW. H. (Sir William) Bragg and W. L. (Sir Lawrence) Bragg, and X-ray Spectroscopy which is associated with the names of W. H. Bragg, H. G. J. Moseley, M. de Broglie and Manne Siegbahn. Crystal Structure Analysis began in November 1912 with the first papers ofW. L. Bragg, then still a student in Cambridge, in which, by analysis of the Laue diagrams _of zinc blende, he determined the correct lattice upon which the structure of this crystal is built.
Author |
: Frank Smith |
Publisher |
: CRC Press |
Total Pages |
: 1012 |
Release |
: 1999-09-22 |
ISBN-10 |
: 9781482276114 |
ISBN-13 |
: 1482276119 |
Rating |
: 4/5 (14 Downloads) |
Synopsis Industrial Applications of X-Ray Diffraction by : Frank Smith
By illustrating a wide range of specific applications in all major industries, this work broadens the coverage of X-ray diffraction beyond basic tenets, research and academic principles. The book serves as a guide to solving problems faced everyday in the laboratory, and offers a review of the current theory and practice of X-ray diffraction, major
Author |
: C. Suryanarayana |
Publisher |
: Springer Science & Business Media |
Total Pages |
: 275 |
Release |
: 2013-06-29 |
ISBN-10 |
: 9781489901484 |
ISBN-13 |
: 1489901485 |
Rating |
: 4/5 (84 Downloads) |
Synopsis X-Ray Diffraction by : C. Suryanarayana
In this, the only book available to combine both theoretical and practical aspects of x-ray diffraction, the authors emphasize a "hands on" approach through experiments and examples based on actual laboratory data. Part I presents the basics of x-ray diffraction and explains its use in obtaining structural and chemical information. In Part II, eight experimental modules enable the students to gain an appreciation for what information can be obtained by x-ray diffraction and how to interpret it. Examples from all classes of materials -- metals, ceramics, semiconductors, and polymers -- are included. Diffraction patterns and Bragg angles are provided for students without diffractometers. 192 illustrations.
Author |
: B. E. Warren |
Publisher |
: Courier Corporation |
Total Pages |
: 402 |
Release |
: 2012-05-23 |
ISBN-10 |
: 9780486141619 |
ISBN-13 |
: 0486141616 |
Rating |
: 4/5 (19 Downloads) |
Synopsis X-Ray Diffraction by : B. E. Warren
Rigorous graduate-level text stresses modern applications to nonstructural problems such as temperature vibration effects, order-disorder phenomena, crystal imperfections, more. Problems. Six Appendixes include tables of values. Bibliographies.
Author |
: |
Publisher |
: Springer Science & Business Media |
Total Pages |
: 309 |
Release |
: 2013-11-11 |
ISBN-10 |
: 9789401737036 |
ISBN-13 |
: 9401737037 |
Rating |
: 4/5 (36 Downloads) |
Synopsis World Directory of Crystallographers by :
Author |
: G. E. Bacon |
Publisher |
: Elsevier |
Total Pages |
: 393 |
Release |
: 2013-09-03 |
ISBN-10 |
: 9781483158297 |
ISBN-13 |
: 1483158292 |
Rating |
: 4/5 (97 Downloads) |
Synopsis X-Ray and Neutron Diffraction by : G. E. Bacon
X-Ray and Neutron Diffraction describes the developments of the X-ray and the various research done in neutron diffraction. Part I of the book concerns the principles and applications of the X-ray and neutrons through their origins from classical crystallography. The book explains the use of diffraction methods to show the highly regular arrangement of atoms that forms a continuous pattern in three-dimensional space. The text evaluates the limitations and benefits of using the different types of radiation sources, whether these are X-rays, neutrons, or electrons. Part II is a collection of reprints discussing the development of techniques that includes a modification of the Bragg method, which is a method of X-ray crystal analysis. One paper presents an improved numerical method of two-dimensional Fourier synthesis for crystals. This method uses a greatly reduced process of arrangement of sets of figures found in the two-dimensional Fourier series. The book also notes the theoretical considerations and the practical details, and then addresses precautions against possible inclusions of errors in this method. The text deals as well with the magnetic scattering of neutrons, and one paper presents a simple method of gathering information about the magnetic moment of the neutron besides the traditional Stern-Gerlach method. Nuclear scientists and physicists, atomic researchers, and nuclear engineers will greatly appreciate the book.
Author |
: Christopher Hammond |
Publisher |
: Oxford University Press, USA |
Total Pages |
: 352 |
Release |
: 2001 |
ISBN-10 |
: 0198505523 |
ISBN-13 |
: 9780198505525 |
Rating |
: 4/5 (23 Downloads) |
Synopsis The Basics of Crystallography and Diffraction by : Christopher Hammond
The present book provides a clear and comprehensive introduction to the topics of crystallography and diffraction for undergraduate and beginning graduate students and lecturers in physics, chemistry, materials and earth sciences, but will also be of interest to the layperson who wishes toknow about these topics beyond the level given in more general trade science books. The book shows how crystal structures may be built up from simple ideas of atomic packing and co-ordination, and develops the concepts of crystal symmetry, point and space groups by way of two-dimensional examples ofpatterns and tilings. Furthermore, the concept of the reciprocal lattice is explained in simple terms and its importance in an understanding of light, x-ray and electron diffraction shown. Finally, the book covers practical examples of the applications of these techniques, and describes theimportance of diffraction in the performance of optical instruments. For this second edition, the existing material has been thoroughly updated, additional figures and exercises have been supplied and two new chapters added. From reviews on the 1/e: '... This is a timely, well-constructed bookwhich should be seriously considered by every teacher of crystallography and can be recommended to anyone who wants to get to grips with crystallography and diffraction.' P. Goodhew, Journal of Microscopy, June 1998 'IUCr publications have always been outstanding for quality of presentation andexposition and this book maintains that high standard.' J.E. Chisholm, Mineralogical Magazine, February 1998
Author |
: André Authier |
Publisher |
: Oxford University Press, USA |
Total Pages |
: 700 |
Release |
: 2004 |
ISBN-10 |
: 0198528922 |
ISBN-13 |
: 9780198528920 |
Rating |
: 4/5 (22 Downloads) |
Synopsis Dynamical Theory of X-ray Diffraction by : André Authier
Publisher Description
Author |
: Shih-Lin Chang |
Publisher |
: Springer Science & Business Media |
Total Pages |
: 458 |
Release |
: 2004-06-24 |
ISBN-10 |
: 3540211969 |
ISBN-13 |
: 9783540211969 |
Rating |
: 4/5 (69 Downloads) |
Synopsis X-Ray Multiple-Wave Diffraction by : Shih-Lin Chang
This comprehensive text describes the fundamentals of X-ray multiple-wave interaction in crystals and its applications in condensed matter physics and crystallography. It covers current theoretical approaches and application methods for many materials, including macromolecular crystals, thin films, semiconductors, quasicrystals and nonlinear optical materials. X-ray optics is also addressed. Designed primarily as a reference for researchers in condensed matter, crystallography, materials science, and synchrotron-related topics, the book will also be useful as a textbook for graduate and senior-year undergraduate courses on special topics in X-ray diffraction.