A unique and in-depth discussion uncovering the unifying features of collision phenomena in liquids and solids, along with applications.

A comprehensive account of the physical foundations of collision and impact phenomena and their applications in a multitude of engineering disciplines. In-depth explanations are included to reveal the unifying features of collision phenomena in both liquids and solids, and to apply them to disciplines including theoretical and applied mechanics, physics and applied mathematics, materials science, aerospace, mechanical and chemical engineering, and terminal ballistics. Covering a range of examples from drops, jets, and sprays, to seaplanes and ballistic projectiles, and detailing a variety of theoretical, numerical, and experimental tools that can be used in developing new models and approaches, this is an ideal resource for students, researchers, and practicing engineers alike.

An integral overview of the theory and design of printheads, authored by an expert with over 30 years' experience in the field of inkjet printing. Clearly structured, the book presents the design of a printhead in a comprehensive and clear form, right from the start. To begin with, the working principle of piezo-driven drop-on-demand printheads in theory is discussed, building on the theory of mechanical vibrations and acoustics. Then the design of single-nozzle as well as multi-nozzle printheads is presented, including the importance of various parameters that need to be optimized, such as viscosity, surface tension and nozzle shape. Topics such as refilling the nozzle and the impact of the droplet on the surface are equally treated. The text concludes with a unique set of worked-out questions for training purposes as well as case studies and a look at what the future holds. An essential reference for beginning as well as experienced researchers, from ink developers to mechanical engineers, both in industry and academia.

Volume 1 of Point Defects in Solids has as its major emphasis defects in ionic solids. Volume 2 now extends this emphasis to semiconductors. The first four chapters treat in some detail the creation, kinetic behavior, inter actions, and physical properties of both simple and composite defects in a variety of semiconducting systems. Also included, as in Vol. 1, are chapters on special topics, namely phonon-defect interactions and defects in organic crystals. Defect behavior in semiconductors has been a subject of considerable interest since the discovery some twenty-five years ago that fast neutron irradiation profoundly affected the electrical characteristics of germanium and silicon. Present-day interest has been stimulated by such semiconductor applications as solar cell power plants for space stations and satellites and semiconductor particle and y-ray detectors, since in both radiation damage can cause serious deterioration. Of even greater practical concern is the need to understand particle damage in order to capitalize upon the develop ing technique of ion implantation as a means of device fabrication. Although the periodic international conferences on radiation effects in semiconductors have served the valuable function of summarizing the extensive work being done in this field, these proceedings are much too detailed and lack the background discussion needed to make them useful to the novice.

This monograph deals with ion induced electron emission from crystalline solids bombarded by fast ions. During the past decade, electron spectroscopy combined with the ion channeling technique has revealed various "messages" about ion solid and electron solid interactions carried by the emitted elec trons. While the ion induced electrons produced by binary encounter pro cesses are of primary interest in this book, closely related topics such as the emission of ion induced Auger electrons from crystal targets are also reviewed, with emphasis on their interdisciplinary aspects, for example, their relation to photoelectron diffraction. In addition to these topics, the book describes the underlying physics and experimental techniques so that it should provide useful information for students and scientists working in ion beam based re search and development in various areas of atomic and solid state physics, materials science, surface science, etc. I am much indebted to the gererations of students who have passed through my laboratory, since they have stimulated me with elementary but essential questions in various phases of the studies. I am also grateful to T. Azuma, Y. Kido, K. Kimura, H. Naramoto, and S. Seki for critical reading of the manuscript. Tsukuba, August 2001 Hiroshi Kudo Contents Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 1o Terminology and Table of Symbols . . . . . . . . . . . . . . . . . . . . . . . 5 2. 2. 1 Notes on Terminology . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5 2. 2 Frequently Used Symbols . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 3. Binary Encounter Electron Emission . . . . . . . . . . . . . . . . . . . . . . 7 3. 1 Ion Electron Elastic Collisions . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 3. 2 Recoil Cross Section of Orbital Electrons . . . . . . . . . . . . . . . . . .