Advanced Measurement And Test Iv
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Author |
: Ankdrew Parvel |
Publisher |
: Trans Tech Publications Ltd |
Total Pages |
: 230 |
Release |
: 2015-01-12 |
ISBN-10 |
: 9783038267591 |
ISBN-13 |
: 3038267597 |
Rating |
: 4/5 (91 Downloads) |
Synopsis Advanced Measurement and Test IV by : Ankdrew Parvel
Collection of selected, peer reviewed papers from the 2014 4th International Conference on Advanced Measurement and Test, (AMT 2014), November 1-2, 2014, Wuhan, China. The 37 papers are grouped as follows: Chapter 1: Materials Science; Chapter 2: Material Processing and Testing Technology; Chapter 3: Monitoring, Detection, Testing and Measurement Systems and Technologies
Author |
: |
Publisher |
: |
Total Pages |
: 446 |
Release |
: 2000 |
ISBN-10 |
: PSU:000046966704 |
ISBN-13 |
: |
Rating |
: 4/5 (04 Downloads) |
Synopsis 21st AIAA Advanced Measurement and Ground Testing Technology Conference: 00-2528 - 00-2700 by :
Author |
: |
Publisher |
: |
Total Pages |
: 594 |
Release |
: 1998 |
ISBN-10 |
: PSU:000044084349 |
ISBN-13 |
: |
Rating |
: 4/5 (49 Downloads) |
Synopsis 20th AIAA Advanced Measurement and Ground Testing Technology Conference by :
Author |
: Riza Esa |
Publisher |
: Trans Tech Publications Ltd |
Total Pages |
: 2898 |
Release |
: 2011-07-27 |
ISBN-10 |
: 9783038136279 |
ISBN-13 |
: 3038136271 |
Rating |
: 4/5 (79 Downloads) |
Synopsis Advanced Measurement and Test by : Riza Esa
Volume is indexed by Thomson Reuters CPCI-S (WoS). This second collection on Advanced Measurement and Test II is dedicated to the electronic testing of devices, boards and systems; covering the complete cycle from design verification, design-for-testing, design-for-manufacturing, silicon de-bugging, manufacturing testing, system testing, diagnosis, failure analysis ... and back to process and design improvement. This will be an invaluable guide to the topics.
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: |
Publisher |
: |
Total Pages |
: 646 |
Release |
: 1996 |
ISBN-10 |
: PSU:000031212205 |
ISBN-13 |
: |
Rating |
: 4/5 (05 Downloads) |
Synopsis 19th AIAA Advanced Measurement and Ground Testing Technology Conference by :
Author |
: Andy Wu |
Publisher |
: Trans Tech Publications Ltd |
Total Pages |
: 2702 |
Release |
: 2013-07-31 |
ISBN-10 |
: 9783038260974 |
ISBN-13 |
: 3038260975 |
Rating |
: 4/5 (74 Downloads) |
Synopsis Advanced Measurement and Test III by : Andy Wu
The primary aim of the proceeding is the combined coverage of the electronic test of devices, boards and systemscovering the complete cycle from design verification, design-for-test, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, failure analysis and back to process and design improvement at the advanced level. Such an approach enables the engineer to take into account the essential mechanical properties of the material itself and special features of practical implementation, including manufacturing technology, experimental results, and design characteristics.
Author |
: Yanwen Wu |
Publisher |
: Trans Tech Publications |
Total Pages |
: 0 |
Release |
: 2010 |
ISBN-10 |
: 0878492712 |
ISBN-13 |
: 9780878492718 |
Rating |
: 4/5 (12 Downloads) |
Synopsis Advanced Measurement and Test by : Yanwen Wu
A collection on Advanced Measurement and Test that is dedicated to the electronic testing of devices, boards and systems and covers the complete cycle: from design verification, design-for-testing, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, failure analysis and back to process and design improvement.
Author |
: |
Publisher |
: |
Total Pages |
: |
Release |
: 2011 |
ISBN-10 |
: OCLC:839019060 |
ISBN-13 |
: |
Rating |
: 4/5 (60 Downloads) |
Synopsis Advanced Measurement and Test by :
Author |
: |
Publisher |
: IOS Press |
Total Pages |
: 4576 |
Release |
: |
ISBN-10 |
: |
ISBN-13 |
: |
Rating |
: 4/5 ( Downloads) |
Author |
: Martin G. Buehler |
Publisher |
: |
Total Pages |
: 28 |
Release |
: 1974 |
ISBN-10 |
: UIUC:30112104131633 |
ISBN-13 |
: |
Rating |
: 4/5 (33 Downloads) |
Synopsis Microelectronic Test Patterns by : Martin G. Buehler