Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology. Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits. Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces . Also contains problems that can be used as quiz or homework.

Digital Twin Driven Smart Service draws on the latest industry practice and research to explain how to implement digital twin service in a range of scenarios. It addresses relevant theory and methodologies, including product service, prognostic health management service, energy efficient service and testing service. Other sections discuss key enabling technologies supported by cutting-edge case studies of implementation. Drawing on the work of researchers at the forefront of this technology, this book is the ideal guide for anyone interested in product services, manufacturing services and digital twin services. This book is one part of a trilogy on digital twins, the other titles being Digital Twin Driven Smart Design and Digital Twin Driven Smart Manufacturing. - Provides a wide range of applications, including tribological testing, cutting tool service and energy efficiency assessment - Explains everything needed to understand and implement digital twin models for service, including frameworks, theories and technologies - Explores future challenges for research in this area, including the ongoing standardization of digital twin technology