When Jessica goes to the hospital after she breaks her arm, she learns about different X-ray techniques. Includes six actual X-ray images printed on film.

Short presentation of aspects important for the application of X-ray contrast media: Composition and properties of contrast media, handling with respect to stability, purity and sterility; applications, interaction, risks; drugs for prophylaxis and treatment of side effects.

This open access book gives a complete and comprehensive introduction to the fields of medical imaging systems, as designed for a broad range of applications. The authors of the book first explain the foundations of system theory and image processing, before highlighting several modalities in a dedicated chapter. The initial focus is on modalities that are closely related to traditional camera systems such as endoscopy and microscopy. This is followed by more complex image formation processes: magnetic resonance imaging, X-ray projection imaging, computed tomography, X-ray phase-contrast imaging, nuclear imaging, ultrasound, and optical coherence tomography.

A complete introduction to x-ray microscopy, covering optics, 3D and chemical imaging, lensless imaging, radiation damage, and applications.

X-ray computed tomography has been used for several decades as a tool for measuring the three-dimensional geometry of the internal organs in medicine. However, in recent years, we have seen a move in manufacturing industries for the use of X-ray computed tomography; first to give qualitative information about the internal geometry and defects in a component, and more recently, as a fully-quantitative technique for dimensional and materials analysis. This trend is primarily due to the ability of X-ray computed tomography to give a high-density and multi-scale representation of both the external and internal geometry of a component, in a non-destructive, non-contact and relatively fast way. But, due to the complexity of X-ray computed tomography, there are remaining metrological issues to solve and the specification standards are still under development. This book will act as a one-stop-shop resource for students and users of X-ray computed tomography in both academia and industry. It presents the fundamental principles of the technique, detailed descriptions of the various components (hardware and software), current developments in calibration and performance verification and a wealth of example applications. The book will also highlight where there is still work to do, in the perspective that X-ray computed tomography will be an essential part of Industry 4.0.

Master the physics and understand the current applications of modern X-ray and EUV sources with this fully updated second edition.

This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.

Eagerly awaited, this second edition of a best-selling text comprehensively describes from a modern perspective the basics of x-ray physics as well as the completely new opportunities offered by synchrotron radiation. Written by internationally acclaimed authors, the style of the book is to develop the basic physical principles without obscuring them with excessive mathematics. The second edition differs substantially from the first edition, with over 30% new material, including: A new chapter on non-crystalline diffraction - designed to appeal to the large community who study the structure of liquids, glasses, and most importantly polymers and bio-molecules A new chapter on x-ray imaging - developed in close cooperation with many of the leading experts in the field Two new chapters covering non-crystalline diffraction and imaging Many important changes to various sections in the book have been made with a view to improving the exposition Four-colour representation throughout the text to clarify key concepts Extensive problems after each chapter There is also supplementary book material for this title available online (http://booksupport.wiley.com). Praise for the previous edition: "The publication of Jens Als-Nielsen and Des McMorrow's Elements of Modern X-ray Physics is a defining moment in the field of synchrotron radiation... a welcome addition to the bookshelves of synchrotron–radiation professionals and students alike.... The text is now my personal choice for teaching x-ray physics...." —Physics Today, 2002

Rigorous graduate-level text stresses modern applications to nonstructural problems such as temperature vibration effects, order-disorder phenomena, crystal imperfections, more. Problems. Six Appendixes include tables of values. Bibliographies.