Proceedings And Invited Papers
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Author |
: Gábor Lövei |
Publisher |
: Open Book Publishers |
Total Pages |
: 166 |
Release |
: 2021-05-19 |
ISBN-10 |
: 9781800640924 |
ISBN-13 |
: 1800640927 |
Rating |
: 4/5 (24 Downloads) |
Synopsis Writing and Publishing Scientific Papers by : Gábor Lövei
Gábor Lövei’s scientific communication course for students and scientists explores the intricacies involved in publishing primary scientific papers, and has been taught in more than twenty countries. Writing and Publishing Scientific Papers is the distillation of Lövei’s lecture notes and experience gathered over two decades; it is the coursebook many have been waiting for. The book’s three main sections correspond with the three main stages of a paper’s journey from idea to print: planning, writing, and publishing. Within the book’s chapters, complex questions such as ‘How to write the introduction?’ or ‘How to submit a manuscript?’ are broken down into smaller, more manageable problems that are then discussed in a straightforward, conversational manner, providing an easy and enjoyable reading experience. Writing and Publishing Scientific Papers stands out from its field by targeting scientists whose first language is not English. While also touching on matters of style and grammar, the book’s main goal is to advise on first principles of communication. This book is an excellent resource for any student or scientist wishing to learn more about the scientific publishing process and scientific communication. It will be especially useful to those coming from outside the English-speaking world and looking for a comprehensive guide for publishing their work in English.
Author |
: |
Publisher |
: |
Total Pages |
: 92 |
Release |
: 1997 |
ISBN-10 |
: MINN:31951D03009605O |
ISBN-13 |
: |
Rating |
: 4/5 (5O Downloads) |
Synopsis Proceedings--limits of Acceptable Change and Related Planning Processes by :
Author |
: Hubert Kiechle |
Publisher |
: Springer Science & Business Media |
Total Pages |
: 338 |
Release |
: 2005-04-19 |
ISBN-10 |
: 1402033907 |
ISBN-13 |
: 9781402033902 |
Rating |
: 4/5 (07 Downloads) |
Synopsis Nearrings and Nearfields by : Hubert Kiechle
The present volume is the Proceedings of the 18th International Conference on Nearrings and Nearfields held at the Helmut-Schmidt-Universität, Universität der Bundeswehr Hamburg, from July 27 – August 3, 2003. It contains the written versions of the lectures by the five invited speakers. These concern recent developments of planar nearrings, nearrings of mappings, group nearrings and loop-nearrings. One of them is a long and very substantial research paper "The Z-Constrained Conjecture". They are followed by 13 contributions reflecting the diversity of the subject of nearrings and related structures. Besides the purely algebraic structure theory these papers show many connections of nearring theory with group theory, combinatorics, geometries, and topology. They all contain original research.
Author |
: Gideon Rivlin |
Publisher |
: Karger Medical and Scientific Publishers |
Total Pages |
: 108 |
Release |
: 1995-01-01 |
ISBN-10 |
: 3805561512 |
ISBN-13 |
: 9783805561518 |
Rating |
: 4/5 (12 Downloads) |
Synopsis Guide to Organizing an International Scientific Conference by : Gideon Rivlin
Whether you are organizing a scientific conference for under 400 participants or attempting to attract upwards of 5,000 delegates, this step-by-step guide will be your essential desk-top companion. It provides professional and non-professional meeting planners alike with all the necessary information on organizing and running an international scientific conference. Key procedures covered include identifying a suitable centre for the event, arranging delegate accommodation, establishing a registration system and preparing the scientific program. The book also evaluates the importance of technology in the planning and organizing of these events. In this timely and informative publication, the author shares the vast wealth of knowledge he has acquired during 30 years' experience of organizing international conferences. It will become for many a valuable reference to the planning and successful realization of scientific events.
Author |
: Yahiko Kambayashi |
Publisher |
: World Scientific |
Total Pages |
: 434 |
Release |
: 1997-09-09 |
ISBN-10 |
: 9789814545488 |
ISBN-13 |
: 9814545481 |
Rating |
: 4/5 (88 Downloads) |
Synopsis Information Systems And Technologies For Network Society: Proceedings Of The Ipsj International Symposium by : Yahiko Kambayashi
This volume contains technical papers and panel position papers selected from the proceedings of the International Symposium on Information Systems and Technologies for Network Society, held together with the IPSJ (information processing society of Japan) National Convention, in September 1997. Papers were submitted from all over the world, especially from Japan, Korea and China. Since these countries are believed to form one of the major computer manufacturing centers in the world, a panel on “Computer Science Education for the 21st Century” was set up. A special session on the Japanese project on Software Engineering invited representative researchers from the project, which is supported by the Ministry of Education, Japan.
Author |
: |
Publisher |
: |
Total Pages |
: 486 |
Release |
: 1994-11 |
ISBN-10 |
: PSU:000052606397 |
ISBN-13 |
: |
Rating |
: 4/5 (97 Downloads) |
Synopsis Energy Research Abstracts by :
Author |
: Cor L. Claeys |
Publisher |
: The Electrochemical Society |
Total Pages |
: 408 |
Release |
: 1999 |
ISBN-10 |
: 1566772419 |
ISBN-13 |
: 9781566772419 |
Rating |
: 4/5 (19 Downloads) |
Synopsis ULSI Process Integration by : Cor L. Claeys
Author |
: United States. Congress. Senate. Committee on Commerce, Science, and Transportation |
Publisher |
: |
Total Pages |
: 276 |
Release |
: 1977 |
ISBN-10 |
: LOC:00101593940 |
ISBN-13 |
: |
Rating |
: 4/5 (40 Downloads) |
Synopsis Nominations--April-May by : United States. Congress. Senate. Committee on Commerce, Science, and Transportation
Author |
: |
Publisher |
: |
Total Pages |
: 638 |
Release |
: 1922 |
ISBN-10 |
: NYPL:33433098413366 |
ISBN-13 |
: |
Rating |
: 4/5 (66 Downloads) |
Synopsis Minutes of Proceedings and Discussion on Papers ... by :
Author |
: Steven H. Voldman |
Publisher |
: John Wiley & Sons |
Total Pages |
: 411 |
Release |
: 2009-07-01 |
ISBN-10 |
: 9780470747261 |
ISBN-13 |
: 0470747269 |
Rating |
: 4/5 (61 Downloads) |
Synopsis ESD by : Steven H. Voldman
Electrostatic discharge (ESD) failure mechanisms continue to impact semiconductor components and systems as technologies scale from micro- to nano-electronics. This book studies electrical overstress, ESD, and latchup from a failure analysis and case-study approach. It provides a clear insight into the physics of failure from a generalist perspective, followed by investigation of failure mechanisms in specific technologies, circuits, and systems. The book is unique in covering both the failure mechanism and the practical solutions to fix the problem from either a technology or circuit methodology. Look inside for extensive coverage on: failure analysis tools, EOS and ESD failure sources and failure models of semiconductor technology, and how to use failure analysis to design more robust semiconductor components and systems; electro-thermal models and technologies; the state-of-the-art technologies discussed include CMOS, BiCMOS, silicon on insulator (SOI), bipolar technology, high voltage CMOS (HVCMOS), RF CMOS, smart power, gallium arsenide (GaAs), gallium nitride (GaN), magneto-resistive (MR) , giant magneto-resistors (GMR), tunneling magneto-resistor (TMR), devices; micro electro-mechanical (MEM) systems, and photo-masks and reticles; practical methods to use failure analysis for the understanding of ESD circuit operation, temperature analysis, power distribution, ground rule development, internal bus distribution, current path analysis, quality metrics, (connecting the theoretical to the practical analysis); the failure of each key element of a technology from passives, active elements to the circuit, sub-system to package, highlighted by case studies of the elements, circuits and system-on-chip (SOC) in today’s products. ESD: Failure Mechanisms and Models is a continuation of the author’s series of books on ESD protection. It is an essential reference and a useful insight into the issues that confront modern technology as we enter the Nano-electronic era.