Modern Optical Characterization Techniques For Semiconductors And Semiconductor Devices Proceedings Of A Conference 26 27 March 1987 Bay Point Florida
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| Author |
: O. J. Glembocki |
| Publisher |
: |
| Total Pages |
: 0 |
| Release |
: 1987 |
| ISBN-10 |
: OCLC:989643182 |
| ISBN-13 |
: |
| Rating |
: 4/5 (82 Downloads) |
Synopsis Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices by : O. J. Glembocki
| Author |
: O. J. Glembocki |
| Publisher |
: SPIE-International Society for Optical Engineering |
| Total Pages |
: 296 |
| Release |
: 1987 |
| ISBN-10 |
: UOM:39015012672609 |
| ISBN-13 |
: |
| Rating |
: 4/5 (09 Downloads) |
Synopsis Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices by : O. J. Glembocki
| Author |
: New York Public Library. Research Libraries |
| Publisher |
: |
| Total Pages |
: 708 |
| Release |
: 1987 |
| ISBN-10 |
: UOM:39015055039005 |
| ISBN-13 |
: |
| Rating |
: 4/5 (05 Downloads) |
Synopsis Bibliographic Guide to Conference Publications by : New York Public Library. Research Libraries
Vols. for 1975- include publications cataloged by the Research Libraries of the New York Public Library with additional entries from the Library of Congress MARC tapes.
| Author |
: British Library. Lending Division |
| Publisher |
: |
| Total Pages |
: 492 |
| Release |
: 1988 |
| ISBN-10 |
: UVA:X004173380 |
| ISBN-13 |
: |
| Rating |
: 4/5 (80 Downloads) |
Synopsis Index of Conference Proceedings Received by : British Library. Lending Division
| Author |
: John Lowell |
| Publisher |
: Society of Photo Optical |
| Total Pages |
: 302 |
| Release |
: 1995 |
| ISBN-10 |
: 0819420042 |
| ISBN-13 |
: 9780819420046 |
| Rating |
: 4/5 (42 Downloads) |
Synopsis Optical Characterization Techniques for High-performance Microelectronic Device Manufacturing II by : John Lowell
| Author |
: |
| Publisher |
: |
| Total Pages |
: 960 |
| Release |
: 1988 |
| ISBN-10 |
: MINN:31951D00767523B |
| ISBN-13 |
: |
| Rating |
: 4/5 (3B Downloads) |
Synopsis INIS Atomindeks by :
| Author |
: |
| Publisher |
: |
| Total Pages |
: 220 |
| Release |
: 1994 |
| ISBN-10 |
: OCLC:746483544 |
| ISBN-13 |
: |
| Rating |
: 4/5 (44 Downloads) |
Synopsis Spectroscopic Characterization Techniques for Semiconductor Technology V by :
| Author |
: John Lowell |
| Publisher |
: |
| Total Pages |
: 302 |
| Release |
: 1995 |
| ISBN-10 |
: OCLC:759720609 |
| ISBN-13 |
: |
| Rating |
: 4/5 (09 Downloads) |
Synopsis Optical Characterization Techniques for High-performance Microelectronic Device Manufacturing II by : John Lowell
| Author |
: |
| Publisher |
: |
| Total Pages |
: 240 |
| Release |
: 1996 |
| ISBN-10 |
: UOM:39015036236555 |
| ISBN-13 |
: |
| Rating |
: 4/5 (55 Downloads) |
Synopsis Optical Characterization Techniques for High-performance Microelectronic Device Manufacturing by :
| Author |
: O. J. Glembocki |
| Publisher |
: Society of Photo Optical |
| Total Pages |
: 308 |
| Release |
: 1992 |
| ISBN-10 |
: 0819408395 |
| ISBN-13 |
: 9780819408396 |
| Rating |
: 4/5 (95 Downloads) |
Synopsis Spectroscopic Characterization Techniques for Semiconductor Technology IV by : O. J. Glembocki
