"What are the recent developments in the field of Metrology?" International leading experts answer this question providing both state of the art presentation and a road map to the future of measurement science. The book is organized in six sections according to the areas of expertise, namely: Introduction; Length, Distance and Surface; Voltage, Current and Frequency; Optics; Time and Relativity; Biology and Medicine. Theoretical basis and applications are explained in accurate and comprehensive manner, providing a valuable reference to researchers and professionals.

In the modern era of scientific and technological development, the role of measurements and metrology in scientific research is becoming more and more important due to the increase in the testing of various products. Moreover, requirements for the accuracy and reliability of measurement results are increasing significantly and their ranges are expanding. Improving measurement accuracy allows us to identify the shortcomings of certain technological processes and either eliminate them or reduce their influence. This leads to better-quality products and contributes to saving energy and other resources, as well as raw materials and materials. This book discusses relevant aspects of practical metrological activity to establish traceability of measurements while increasing their accuracy and reliability. It also presents procedures for the calibration and testing of measuring instruments.

Reprint of the original, first published in 1882.

This book is a collection of chapters linked together by a logical framework aimed at exploring the modern role of the measurement science in both the technically most advanced applications and in everyday life Provides a unique methodological approach to understanding modern measurements Important methods and devices are presented in a synthetic and easy-to-understand way Includes end-of-chapter exercises and solutions

A comprehensive, hands-on review of the most up-to-date techniques in RF and microwave measurement, including practical advice on deployment challenges.

This volume provides a comprehensive introduction and explanation of both the theory and practice of all forms of modern antenna measurements, electromagnetic theory, antenna coupling, compact range measurements, near-field antenna measurements, mobile and body-centric antenna measurements.

In this concise book, the author presents the essentials every chemist needs to know about how to obtain reliable measurement results. Starting with the basics of metrology and the metrological infrastructure, all relevant topics – such as traceability, calibration, chemical reference materials, validation and uncertainty – are covered. In addition, key aspects of laboratory management, including quality management, inter-laboratory comparisons, proficiency testing, and accreditation, are addressed.

​This handbook provides comprehensive and up-to-date information on the topic of scientific, industrial and legal metrology. It discusses the state-of-art review of various metrological aspects pertaining to redefinition of SI Units and their implications, applications of time and frequency metrology, certified reference materials, industrial metrology, industry 4.0, metrology in additive manufacturing, digital transformations in metrology, soft metrology and cyber security, optics in metrology, nano-metrology, metrology for advanced communication, environmental metrology, metrology in biomedical engineering, legal metrology and global trade, ionizing radiation metrology, advanced techniques in evaluation of measurement uncertainty, etc. The book has contributed chapters from world’s leading metrologists and experts on the diversified metrological theme. The internationally recognized team of editors adopt a consistent and systematic approach and writing style, including ample cross reference among topics, offering readers a user-friendly knowledgebase greater than the sum of its parts, perfect for frequent consultation. Moreover, the content of this volume is highly interdisciplinary in nature, with insights from not only metrology but also mechanical/material science, optics, physics, chemistry, biomedical and more. This handbook is ideal for academic and professional readers in the traditional and emerging areas of metrology and related fields.

Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 1: Foundations discusses the fundamental concepts along with recent and emerging applications. The core physics is that of photoionization, and Volume 1 addresses this topic. The foundational material is presented in part as a tutorial with extensive numerical examples and also in part as a collected reference to the relevant theoretical treatments from the literature for a range of cases. Topics are discussed with an eye to developing general quantum metrology schemes, in which full quantum state reconstruction of the photoelectron wavefunction is the goal. In many cases, code and/or additional resources are available online. Consequently, it is hoped that readers at all levels will find something of interest and that the material provides something rather different from existing textbooks.