Digital Evaluation And Failure Analysis Data
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Author |
: |
Publisher |
: |
Total Pages |
: 1098 |
Release |
: 1988 |
ISBN-10 |
: PSU:000015824370 |
ISBN-13 |
: |
Rating |
: 4/5 (70 Downloads) |
Synopsis Electronic Reliability Design Handbook by :
Author |
: Joseph Berk |
Publisher |
: ASM International |
Total Pages |
: 209 |
Release |
: 2009-01-01 |
ISBN-10 |
: 9781615031375 |
ISBN-13 |
: 1615031375 |
Rating |
: 4/5 (75 Downloads) |
Synopsis Systems Failure Analysis by : Joseph Berk
Author |
: K.B. Misra |
Publisher |
: Elsevier |
Total Pages |
: 907 |
Release |
: 2012-12-02 |
ISBN-10 |
: 9780444598158 |
ISBN-13 |
: 0444598154 |
Rating |
: 4/5 (58 Downloads) |
Synopsis Reliability Analysis and Prediction by : K.B. Misra
This book equips the reader with a compact information source on all the most recent methodological tools available in the area of reliability prediction and analysis. Topics covered include reliability mathematics, organisation and analysis of data, reliability modelling and system reliability evaluation techniques. Environmental factors and stresses are taken into account in computing the reliability of the involved components. The limitations of models, methods, procedures, algorithms and programmes are outlined. The treatment of maintained systems is designed to aid the worker in analysing systems with more realistic and practical assumptions. Fault tree analysis is also extensively discussed, incorporating recent developments. Examples and illustrations support the reader in the solving of problems in his own area of research. The chapters provide a logical and graded presentation of the subject matter bearing in mind the difficulties of a beginner, whilst bridging the information gap for the more experienced reader. The work will be of considerable interest to engineers working in various industries, research organizations, particularly in defence, nuclear, chemical, space or communications. It will also be an indispensable study aid for serious-minded students and teachers.
Author |
: Marius Bazu |
Publisher |
: John Wiley & Sons |
Total Pages |
: 372 |
Release |
: 2011-03-08 |
ISBN-10 |
: 9781119990000 |
ISBN-13 |
: 1119990009 |
Rating |
: 4/5 (00 Downloads) |
Synopsis Failure Analysis by : Marius Bazu
Failure analysis is the preferred method to investigate product or process reliability and to ensure optimum performance of electrical components and systems. The physics-of-failure approach is the only internationally accepted solution for continuously improving the reliability of materials, devices and processes. The models have been developed from the physical and chemical phenomena that are responsible for degradation or failure of electronic components and materials and now replace popular distribution models for failure mechanisms such as Weibull or lognormal. Reliability engineers need practical orientation around the complex procedures involved in failure analysis. This guide acts as a tool for all advanced techniques, their benefits and vital aspects of their use in a reliability programme. Using twelve complex case studies, the authors explain why failure analysis should be used with electronic components, when implementation is appropriate and methods for its successful use. Inside you will find detailed coverage on: a synergistic approach to failure modes and mechanisms, along with reliability physics and the failure analysis of materials, emphasizing the vital importance of cooperation between a product development team involved the reasons why failure analysis is an important tool for improving yield and reliability by corrective actions the design stage, highlighting the ‘concurrent engineering' approach and DfR (Design for Reliability) failure analysis during fabrication, covering reliability monitoring, process monitors and package reliability reliability resting after fabrication, including reliability assessment at this stage and corrective actions a large variety of methods, such as electrical methods, thermal methods, optical methods, electron microscopy, mechanical methods, X-Ray methods, spectroscopic, acoustical, and laser methods new challenges in reliability testing, such as its use in microsystems and nanostructures This practical yet comprehensive reference is useful for manufacturers and engineers involved in the design, fabrication and testing of electronic components, devices, ICs and electronic systems, as well as for users of components in complex systems wanting to discover the roots of the reliability flaws for their products.
Author |
: Daniel P. Dennies |
Publisher |
: ASM International |
Total Pages |
: 228 |
Release |
: 2005 |
ISBN-10 |
: 9781615030484 |
ISBN-13 |
: 1615030484 |
Rating |
: 4/5 (84 Downloads) |
Synopsis How to Organize and Run a Failure Investigation by : Daniel P. Dennies
Learning the proper steps for organizing a failure investigation ensures success. Failure investigations cross company functional boundaries and are an integral component of any design or manufacturing business operation. Well-organized and professionally conducted investigations are essential for solving manufacturing problems and assisting in redesigns. This book outlines a proven systematic approach to failure investigation. It explains the relationship between various failure sources (corrosion, for example) and the organization and conduct of the investigation. It provides a learning platform for engineers from all disciplines: materials, design, manufacturing, quality, and management. The examples in this book focus on the definition of and requirements for a professionally performed failure analysis of a physical object or structure. However, many of the concepts have much greater utility than for investigating the failure of physical objects. For example, the book provides guidance in areas such as learning how to define objectives, negotiating the scope of investigation, examining the physical evidence, and applying general problem-solving techniques.
Author |
: Technology Reports Centre (Great Britain) |
Publisher |
: |
Total Pages |
: 732 |
Release |
: 1979 |
ISBN-10 |
: STANFORD:36105014644202 |
ISBN-13 |
: |
Rating |
: 4/5 (02 Downloads) |
Synopsis R & D Abstracts by : Technology Reports Centre (Great Britain)
Author |
: |
Publisher |
: |
Total Pages |
: 436 |
Release |
: 1984 |
ISBN-10 |
: UIUC:30112008155852 |
ISBN-13 |
: |
Rating |
: 4/5 (52 Downloads) |
Synopsis Microcircuit Device Reliability by :
Author |
: Defense Documentation Center (U.S.) |
Publisher |
: |
Total Pages |
: 128 |
Release |
: 1975 |
ISBN-10 |
: IND:30000139891570 |
ISBN-13 |
: |
Rating |
: 4/5 (70 Downloads) |
Synopsis Digest - Defense Documentation Center by : Defense Documentation Center (U.S.)
Author |
: |
Publisher |
: |
Total Pages |
: 484 |
Release |
: 1978 |
ISBN-10 |
: CORNELL:31924057183778 |
ISBN-13 |
: |
Rating |
: 4/5 (78 Downloads) |
Synopsis Technical Abstract Bulletin by :
Author |
: Henry C. Rickers |
Publisher |
: |
Total Pages |
: 120 |
Release |
: 1978 |
ISBN-10 |
: STANFORD:36105030596097 |
ISBN-13 |
: |
Rating |
: 4/5 (97 Downloads) |
Synopsis Microcircuit Screening Effectiveness by : Henry C. Rickers
This information is utilized to determine efficiency factors of individual screens/tests and is combined with cost information to assess screening effectiveness and to provide the proper guidance in determining the optimal screening program for any specific situation. (Author).